Reliability And Radiation Effects In Compound Semiconductors
Finna-arvio
Reliability And Radiation Effects In Compound Semiconductors
Tallennettuna:
Kieli |
englanti |
---|---|
Julkaisija |
World Scientific Publishing Company,
2010
|
Aiheet | |
ISBN |
981-4277-10-X 9786613143747 1-61583-687-X 1-283-14374-7 981-4277-11-8 |
Hae kokoteksti |