Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
Finna-arvio
Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
Tallennettuna:
| Ulkoasu |
[3], 20 sivua : kuvitettu ; 21 cm |
|---|---|
| Kieli |
englanti |
| Alkuteoksen kieli |
englanti |
| Huomautukset |
Submitted for publ. in a periodical. |
| Julkaisija |
[Hki] :
[Helsinki University of Technology],
1982.
|
| Sarja | Report / Helsinki University of Technology. Laboratory of Physics, ISSN 0359-6214; 112. |
| Luokitus | |
| Lisätiedot | V. P. Tanninen, M. Oikkonen and T. Tuomi |