Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
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Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation
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| Physical Description |
[3], 20 sivua : kuvitettu ; 21 cm |
|---|---|
| Language |
English |
| Language of Original Work |
English |
| Item Description |
Submitted for publ. in a periodical. |
| Publisher |
[Hki] :
[Helsinki University of Technology],
1982.
|
| Series | Report / Helsinki University of Technology. Laboratory of Physics, ISSN 0359-6214; 112. |
| Classification | |
| Additional Information | V. P. Tanninen, M. Oikkonen and T. Tuomi |