Semiconductor memories : technology, testing, and reliability
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Semiconductor memories : technology, testing, and reliability
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| Genre | |
|---|---|
| Physical Description |
1 PDF (xii, 462 pages) : illustrations Also available in print |
| Language |
English |
| Language of Original Work |
English |
| Item Description |
"IEEE order number: PC3491"--P. [4] cover. "IEEE Solid-State Circuits Council, sponsor." |
| Publisher |
Piscataway, New Jersey :
IEEE Press,
c1997.
|
| Subjects | |
| Additional Information | Ashok K. Sharma |
| Painettu |
9780780310001 |
| Bibliography |
Includes bibliographical references and index. |
| ISBN |
9780470546406 electronic electronic |
| DOI | 10.1109/9780470546406 |
| Access | Luettavissa Jyväskylän yliopiston verkossa; Access limited to Jyväskylä University network |
| Notes |
IEEE |
| Standard Codes |
doi 10.1109/9780470546406 |
| Publisher or Distributor Number |
IEEE 5264189 IEEE ocn557450363 |
| Get full text | |