Reliability wearout mechanisms in advanced CMOS technologies
Finna-arvio
Reliability wearout mechanisms in advanced CMOS technologies
Tallennettuna:
| Genre | |
|---|---|
| Ulkoasu |
1 PDF (xv, 624 pages) : illustrations |
| Kieli |
englanti |
| Alkuteoksen kieli |
englanti |
| Julkaisija |
Piscataway, New Jersey :
IEEE Press,
c2009.
|
| Sarja | IEEE Press Series on Microelectronic Systems, 12. |
| Aiheet | |
| Lisätiedot | Alvin W. Strong ... [ja muita] |
| Painettu |
9780471731726 |
| Bibliografia |
Includes bibliographical references and index. |
| ISBN |
paper electronic 9780470455265 electronic |
| DOI | 10.1002/9780470455265 |
| Pääsy | Luettavissa Jyväskylän yliopiston verkossa; Access limited to Jyväskylä University network |
| Huomautukset |
IEEE |
| Standarditunnukset |
doi 10.1002/9780470455265 |
| Julkaisijan tunnus |
IEEE 5361029 IEEE ocn463436649 |
| Hae kokoteksti | |