Semiconductor material and device characterization
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Semiconductor material and device characterization
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| Genre | |
|---|---|
| Physical Description |
1 PDF (xv, 779 pages) : illustrations Also available in print |
| Language |
English |
| Language of Original Work |
English |
| Item Description |
"Wiley-Interscience." |
| Publisher |
[Piscataway, New Jersey] :
IEEE Press,
c2006.
|
| Subjects | |
| Additional Information | Dieter K. Schroder |
| Painettu |
9780471739067 |
| Bibliography |
Includes bibliographical references and index. |
| ISBN |
9780471749097 electronic electronic |
| DOI | 10.1002/0471749095 |
| Access | Luettavissa Jyväskylän yliopiston verkossa; Access limited to Jyväskylä University network |
| Notes |
IEEE |
| Standard Codes |
doi 10.1002/0471749095 |
| Publisher or Distributor Number |
IEEE 5237928 IEEE ocn163140623 |
| Get full text | |